PCIe 6.0 Migration: Tackling PAM4 Signal Integrity, Equalization Complexity, and Test Maturity Gaps
The article details the technical risks and a six-step engineering sequence for migrating from PCIe 5.0 (32 GT/s NRZ) to 6.0 (64 GT/s PAM4), covering 6 mV eye-height vulnerability, FFE/DFE/CTLE equalization explosion, evolving SigTest/PAM4 BERT toolchains, stressed-eye calibration complexity, living CEM/ECN specs, and backward-compatibility validation across NRZ and PAM4 modes.
